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DATE
2007
IEEE
14 years 1 months ago
2007
IEEE
1 The increasing test data volume needed to test core-based System-on-Chip contributes to long test application times (TAT) and huge automatic test equipment (ATE) memory requireme...
ENTCS
2008
13 years 7 months ago
2008
HOL-TestGen is a specification and test case generation environment extending the interactive theorem prover Isabelle/HOL. The HOL-TestGen method is two-staged: first, the origina...
LICS
1992
IEEE
13 years 11 months ago
1992
IEEE
d Abstract) Frank S. de Boer, Jan Willem Klopyz , Catuscia Palamidessiyx We study the paradigm of asynchronous process communication, as contrasted with the synchronous communicat...
COMPSAC
2003
IEEE
14 years 24 days ago
2003
IEEE
Usual techniques for automatic test data generation are based on the assumption that a complete oracle will be available during the testing process. However, there are programs fo...
LPNMR
2009
Springer
14 years 1 days ago
2009
Springer
Abstract. In answer-set programming (ASP), the main focus usually is on computing answer sets which correspond to solutions to the problem represented by a logic program. Simple re...