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DATE
2009
IEEE
125views Hardware» more  DATE 2009»
14 years 2 months ago
On linewidth-based yield analysis for nanometer lithography
— Lithographic variability and its impact on printability is a major concern in today’s semiconductor manufacturing process. To address sub-wavelength printability, a number of...
Aswin Sreedhar, Sandip Kundu
ICASSP
2011
IEEE
12 years 11 months ago
Spatially-correlated sensor discriminant analysis
A study of generalization error in signal detection by multiple spatially-distributed and -correlated sensors is provided when the detection rule is learned from a finite number ...
Kush R. Varshney
NIPS
2008
13 years 8 months ago
Non-stationary dynamic Bayesian networks
Abstract: Structure learning of dynamic Bayesian networks provide a principled mechanism for identifying conditional dependencies in time-series data. This learning procedure assum...
Joshua W. Robinson, Alexander J. Hartemink
KDD
2009
ACM
203views Data Mining» more  KDD 2009»
14 years 8 months ago
Characterizing individual communication patterns
The increasing availability of electronic communication data, such as that arising from e-mail exchange, presents social and information scientists with new possibilities for char...
R. Dean Malmgren, Jake M. Hofman, Luis A. N. Amara...
ICANNGA
2007
Springer
191views Algorithms» more  ICANNGA 2007»
14 years 1 months ago
Novel Multi-layer Non-negative Tensor Factorization with Sparsity Constraints
In this paper we present a new method of 3D non-negative tensor factorization (NTF) that is robust in the presence of noise and has many potential applications, including multi-way...
Andrzej Cichocki, Rafal Zdunek, Seungjin Choi, Rob...