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ISVLSI
2007
IEEE
14 years 5 months ago
2007
IEEE
Performance, power, and functionality, yield and manufacturability are rapidly becoming additional critical factors that must be considered at higher levels of ion. A possible sol...
ICCD
2004
IEEE
14 years 8 months ago
2004
IEEE
In Deep Sub-Micron (DSM) technologies, interconnects play a crucial role in the correct functionality and largely impact the performance of complex System-on-Chip (SoC) designs. F...