Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
Inferring an appropriate DTD or XML Schema Definition (XSD) for a given collection of XML documents essentially reduces to learning deterministic regular expressions from sets of ...
Geert Jan Bex, Wouter Gelade, Frank Neven, Stijn V...
The threat of soft error induced system failure in high performance computing systems has become more prominent, as we adopt ultra-deep submicron process technologies. In this pap...
Distributed real-time automotive embedded systems have to be highly dependable as well as cost-efficient due to the large number of manufactured units. To close the gap between r...
Dietmar Schreiner, Markus Schordan, Karl M. Gö...
The ability to perform long, accurate molecular dynamics (MD) simulations involving proteins and other biological macromolecules could in principle provide answers to some of the ...
David E. Shaw, Martin M. Deneroff, Ron O. Dror, Je...