218 search results - page 26 / 44 » A Neural Adaptive Algorithm for Feature Selection and Classi... |
EVOW
2008
Springer
13 years 10 months ago
2008
Springer
Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
ICIP
2007
IEEE
14 years 2 months ago
2007
IEEE
We consider approaches for exact similarity search in a high dimensional space of correlated features representing image datasets, based on principles of clustering and vector qua...
BMCBI
2010
13 years 8 months ago
2010
Background: Because a priori knowledge about function of G protein-coupled receptors (GPCRs) can provide useful information to pharmaceutical research, the determination of their ...
BTW
2009
Springer
13 years 9 months ago
2009
Springer
Abstract: Multimedia databases are increasingly common in science, business, entertainment and many other applications. Their size and high dimensionality of features are major cha...
ICPR
2006
IEEE
14 years 9 months ago
2006
IEEE
We propose a competitive finite mixture of neurons (or perceptrons) for solving binary classification problems. Our classifier includes a prior for the weights between different n...