Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
We consider approaches for exact similarity search in a high dimensional space of correlated features representing image datasets, based on principles of clustering and vector qua...
Background: Because a priori knowledge about function of G protein-coupled receptors (GPCRs) can provide useful information to pharmaceutical research, the determination of their ...
Abstract: Multimedia databases are increasingly common in science, business, entertainment and many other applications. Their size and high dimensionality of features are major cha...
We propose a competitive finite mixture of neurons (or perceptrons) for solving binary classification problems. Our classifier includes a prior for the weights between different n...
Karthik Sridharan, Matthew J. Beal, Venu Govindara...