465 search results - page 20 / 93 » A New Approach for Low Power Scan Testing |
ICCAD
1992
IEEE
13 years 11 months ago
1992
IEEE
Excessive power dissipation in integrated circuits causes overheating and can lead to soft errors and or permanent damage. The severity of the problem increases in proportion to t...
PCM
2010
Springer
13 years 5 months ago
2010
Springer
Abstract. Content retrieval of scanned line drawing images is a difficult problem, especially from real-life large scale databases. Existing algorithms don’t work well due to th...
BMCBI
2007
13 years 7 months ago
2007
Background: Identity by descent (IBD) matrix estimation is a central component in mapping of Quantitative Trait Loci (QTL) using variance component models. A large number of algor...
SIGPRO
2008
13 years 7 months ago
2008
In this paper, an improved approach to blind deconvolution of LTI systems incorporating phase unwrapping is presented. The method can recover a noise-free estimate of the logarith...
DAC
1995
ACM
13 years 11 months ago
1995
ACM
We propose a novel optimization scheme that can improve the routing by reducing a newly observed router decaying effect. A pair of greedy-grow algorithms, each emphasizing a diffe...