465 search results - page 4 / 93 » A New Approach for Low Power Scan Testing |
ICCD
2004
IEEE
14 years 4 months ago
2004
IEEE
— Reduction in test power is important to improve battery life in portable devices employing periodic self-test, to increase reliability of testing and to reduce test-cost. In sc...
CLEF
2010
Springer
13 years 8 months ago
2010
Springer
We propose to use MapReduce to quickly test new retrieval approaches on a cluster of machines by sequentially scanning all documents. We present a small case study in which we use ...
ATS
2004
IEEE
13 years 11 months ago
2004
IEEE
In this paper, we propose a low-power testing methodology for the scan-based BIST. A smoother is included in the test pattern generator (TPG) to reduce average power consumption d...
DFT
2004
IEEE
13 years 11 months ago
2004
IEEE
This paper presents a novel delay fault testing technique, which can be used as an alternative to the enhanced scan based delay fault testing, with significantly less design overh...
MTV
2007
IEEE
14 years 1 months ago
2007
IEEE
Test vector ordering is recognized as a simple and non-intrusive approach to assist test power reduction. Simulation based test vector ordering approach to minimize circuit transit...