Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
Yanti Santoso, Matthew C. Merten, Elizabeth M. Rud...
Most algorithms used for imaging genetics examine statistical effects of each individual genetic variant, one at a time. We developed a new approach, based on ridge regression, to...
Omid Kohannim, Derrek P. Hibar, Jason L. Stein, Ne...
Supply Chain Management (SCM) involves a number of interrelated activities from negotiating with suppliers to competing for customer orders and scheduling the manufacturing proces...
Our rapidly growing knowledge regarding genetic variation in the human genome offers great potential for understanding the genetic etiology of disease. This, in turn, could revolut...
Margaret J. Eppstein, Joshua L. Payne, Bill C. Whi...
The paper develops a self-tuning resource aware partial evaluation technique for Prolog programs, which derives its own control strategies tuned for the underlying computer archit...