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ISQED
2007
IEEE
14 years 4 months ago
2007
IEEE
In nanometer regime, the effects of variations are having an increasing impact on the delay and power characteristics of devices as well as the yield of the circuit. Statistical t...
ASPDAC
2008
ACM
14 years 10 days ago
2008
ACM
In the nanometer manufacturing region, process variation causes significant uncertainty for circuit performance verification. Statistical static timing analysis (SSTA) is thus dev...
ICPR
2006
IEEE
14 years 11 months ago
2006
IEEE
Tolerance to pose variations is one of the key remaining problems in face recognition. It is of great interest in airport surveillance systems using mugshot databases to screen tr...
WIDM
2003
ACM
14 years 3 months ago
2003
ACM
At the present time, several shortcomings prevent the more effective use and more intense application of web information systems. Recent developments that are subsumed by the term...
ACCV
1998
Springer
14 years 2 months ago
1998
Springer
One of the important problems related to image analysis and compression is finding repeated structure. Although the focus of this paper is developing digital geometric models and m...