An objective of DSP testing should be to ensure that any errors due to missed faults are infrequent compared to a circuit’s intrinsic errors, such as overflow. A method is prop...
Capturing RLCK circuit responses accurately with existing model order reduction (MOR) techniques is very expensive. Direct metrics for fast analysis of RC circuits exist but there...
This paper presents a method for designing bundles in a combinatorial auction protocol that is robust against false-name bids. Internet auctions have become an integral part of El...
Background: In binary high-throughput screening projects where the goal is the identification of low-frequency events, beyond the obvious issue of efficiency, false positives and ...
⎯ Technology scaling is in the era where the chip performance is constrained by its power dissipation. Although the power limits vary with the application domain, they dictate th...