371 search results - page 9 / 75 » A New Method for Interoperability Test Generation |
DSD
2010
IEEE
13 years 9 months ago
2010
IEEE
— In this paper we propose a new method of test patterns compression based on a design of a dedicated SAT-based ATPG (Automatic Test Pattern Generator). This compression method i...
COMCOM
1999
13 years 10 months ago
1999
We present a problem of commonly used characterization sequences (CS) for the protocol conformance testing and propose a new test sequence to resolve the problem. The proposed tes...
ITC
1993
IEEE
14 years 3 months ago
1993
IEEE
This paper presents an efficient approach to generate tests for gate delay faults. Unlike other known algorithms which try to generate a 'good' delay test the presented ...
ISSTA
1998
ACM
14 years 3 months ago
1998
ACM
Automatic test data generation leads to identify input values on which a selected point in a procedure is executed. This paper introduces a new method for this problem based on co...
KBSE
2002
IEEE
14 years 3 months ago
2002
IEEE
Generating test inputs for a path in a function with integer and real parameters is an important but difficult problem. The problem becomes more difficult when pointers are pass...