95 search results - page 1 / 19 » A Novel Functional Test Generation Method for Processors Usi... |
ITC
1997
IEEE
14 years 3 days ago
1997
IEEE
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests for them is becoming a serious problem in industry. This paper...
DAC
1999
ACM
14 years 6 days ago
1999
ACM
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests which can be run at native speeds is becoming a serious proble...
VLSID
2007
IEEE
14 years 8 months ago
2007
IEEE
We introduce a novel method of test generation for microprocessors at the RTL using spectral methods. Test vectors are generated for RTL faults, which are the stuck-at faults on i...
VTS
2000
IEEE
14 years 8 days ago
2000
IEEE
This paper focuses on observability, one of the open issues in High-Level test generation. Three different approximate metrics for taking observability into account during RT-leve...
DAC
2007
ACM
14 years 9 months ago
2007
ACM
Due to shrinking technology, increasing functional frequency and density, and reduced noise margins with supply voltage scaling, the sensitivity of designs to supply voltage noise...