95 search results - page 6 / 19 » A Novel Functional Test Generation Method for Processors Usi... |
EOR
2007
13 years 7 months ago
2007
We introduce a master–worker framework for parallel global optimization of computationally expensive functions using response surface models. In particular, we parallelize two r...
SAFECOMP
2005
Springer
14 years 1 months ago
2005
Springer
As programmable logic controllers(PLCs) have been used in safety-critical applications, testing of PLC applications has become important. The previous PLC-based software testing te...
APSEC
2006
IEEE
14 years 2 months ago
2006
IEEE
Testing for time-related behaviors of PLC software is important and should be performed carefully. We propose a structural testing technique on Function Block Diagram(FBD) network...
VLSID
2007
IEEE
14 years 8 months ago
2007
IEEE
Functional validation of microprocessors is growing in complexity in current and future microprocessors. Traditionally, the different components (or validation collaterals) used i...
VLSID
2010
IEEE
13 years 5 months ago
2010
IEEE
Directed test generation is important for the functional verification of complex system-on-chip designs. SAT based bounded model checking is promising for counterexample generatio...