590 search results - page 15 / 118 » A Novel Method to Improve the Test Efficiency of VLSI Tests |
BMCBI
2006
13 years 7 months ago
2006
Background: Tandem mass spectrometry (MS/MS) is a powerful tool for protein identification. Although great efforts have been made in scoring the correlation between tandem mass sp...
ASPDAC
2004
ACM
14 years 28 days ago
2004
ACM
- Under manufacturing process variation, a path through a fault site is called longest for delay test if there exists a process condition under which the path has the maximum delay...
WCE
2007
13 years 8 months ago
2007
Improving testability during the early stages of High-level synthesis has several advantages including reduced test hardware overhead and design iterations. Recently, BIST techniq...
DSD
2005
IEEE
13 years 9 months ago
2005
IEEE
Several methods improving the fault coverage in mixed-mode BIST are presented in this paper. The test is divided into two phases: the pseudo-random and deterministic. Maximum of f...
TIP
2008
13 years 7 months ago
2008
Several novel and particularly successful object and object category detection and recognition methods based on image features, local descriptions of object appearance, have recent...