33 search results - page 4 / 7 » A Pattern Generation Technique for Maximizing Power Supply C... |
ISPD
2004
ACM
14 years 2 months ago
2004
ACM
High performance integrated circuits are now reaching the 100-plus watt regime, and power delivery and power grid signal integrity have become critical. Analyzing the performance ...
DFT
1997
IEEE
14 years 23 days ago
1997
IEEE
The paper presents a test pattern generation and fault simulation methodology for the detection of catastrophic faults in analogue circuits. The test methodology chosen for evalua...
ISCAS
2005
IEEE
14 years 2 months ago
2005
IEEE
—A new sub-1-V curvature-compensated CMOS bandgap reference, which utilizes the temperature-dependent currents generated from the parasitic n-p-n and p-n-p bipolar junction trans...
MICRO
2006
IEEE
14 years 2 months ago
2006
IEEE
Power delivery is a growing reliability concern in microprocessors as the industry moves toward feature-rich, powerhungrier designs. To battle the ever-aggravating power consumpti...
ISICT
2003
13 years 10 months ago
2003
Situational information can enrich the interactions between a user and the services they wish to utilize. Such information encompasses details about the user, the physical environ...