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» A Pitfall in Determining the Optimal Feature Subset Size
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DAC
2003
ACM
14 years 8 months ago
A cost-driven lithographic correction methodology based on off-the-shelf sizing tools
As minimum feature sizes continue to shrink, patterned features have become significantly smaller than the wavelength of light used in optical lithography. As a result, the requir...
Puneet Gupta, Andrew B. Kahng, Dennis Sylvester, J...
CORR
2007
Springer
95views Education» more  CORR 2007»
13 years 7 months ago
Resampling methods for parameter-free and robust feature selection with mutual information
Combining the mutual information criterion with a forward feature selection strategy offers a good trade-off between optimality of the selected feature subset and computation time...
Damien François, Fabrice Rossi, Vincent Wer...
ICML
2010
IEEE
13 years 8 months ago
Feature Selection as a One-Player Game
This paper formalizes Feature Selection as a Reinforcement Learning problem, leading to a provably optimal though intractable selection policy. As a second contribution, this pape...
Romaric Gaudel, Michèle Sebag
CIDM
2009
IEEE
14 years 2 months ago
Large-scale attribute selection using wrappers
Abstract— Scheme-specific attribute selection with the wrapper and variants of forward selection is a popular attribute selection technique for classification that yields good ...
Martin Gutlein, Eibe Frank, Mark Hall, Andreas Kar...
CIKM
2010
Springer
13 years 4 months ago
Regularization and feature selection for networked features
In the standard formalization of supervised learning problems, a datum is represented as a vector of features without prior knowledge about relationships among features. However, ...
Hongliang Fei, Brian Quanz, Jun Huan