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DATE
2009
IEEE
125views Hardware» more  DATE 2009»
14 years 3 months ago
On linewidth-based yield analysis for nanometer lithography
— Lithographic variability and its impact on printability is a major concern in today’s semiconductor manufacturing process. To address sub-wavelength printability, a number of...
Aswin Sreedhar, Sandip Kundu
BMCBI
2010
135views more  BMCBI 2010»
13 years 9 months ago
Simple and flexible classification of gene expression microarrays via Swirls and Ripples
Background: A simple classification rule with few genes and parameters is desirable when applying a classification rule to new data. One popular simple classification rule, diagon...
Stuart G. Baker
IDA
2009
Springer
13 years 6 months ago
Hierarchical Extraction of Independent Subspaces of Unknown Dimensions
Abstract. Independent Subspace Analysis (ISA) is an extension of Independent Component Analysis (ICA) that aims to linearly transform a random vector such as to render groups of it...
Peter Gruber, Harold W. Gutch, Fabian J. Theis
CORR
2007
Springer
126views Education» more  CORR 2007»
13 years 9 months ago
Interference and Outage in Clustered Wireless Ad Hoc Networks
—In the analysis of large random wireless networks, the underlying node distribution is almost ubiquitously assumed to be the homogeneous Poisson point process. In this paper, th...
Radha Krishna Ganti, Martin Haenggi
VTC
2007
IEEE
121views Communications» more  VTC 2007»
14 years 3 months ago
Downlink Traffic Power Characterization for Multi-Rate Wireless CDMA Data Networks
— The characterization of downlink traffic power is an important issue for the design of efficient call admission control (CAC) and radio resource management (RRM) procedures. In...
Ashraf S. Hasan Mahmoud