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GLVLSI
2006
IEEE
101views VLSI» more  GLVLSI 2006»
14 years 1 months ago
Measurement and characterization of pattern dependent process variations of interconnect resistance, capacitance and inductance
Process variations have become a serious concern for nanometer technologies. The interconnect and device variations include interand intra-die variations of geometries, as well as...
Xiaoning Qi, Alex Gyure, Yansheng Luo, Sam C. Lo, ...
WETICE
1997
IEEE
13 years 11 months ago
MultiDisciplinary Design for Uninhabited Air Vehicles
Contemporary product design and process development is based on an iterative specify-evaluate-revise approach which is often time intensive and therein non-responsive to customer ...
Max Blair, Steven R. LeClair, Jeffrey V. Zweber, A...
COLING
1990
13 years 8 months ago
Concept Analysis And Terminology: A Knowledge-Based Approach To Documentation
The central concern of terminology, a component of the general documentation process, is concept analysis, an activity which is becoming recognized as fundamental as term banks evo...
Douglas R. Skuce, Ingrid Meyer
CSCW
2006
ACM
14 years 1 months ago
Shared waypoints and social tagging to support collaboration in software development
This paper presents the conceptual design of TagSEA, a collaborative tool to support asynchronous software development. Our goal is to develop a lightweight source code annotation...
Margaret-Anne D. Storey, Li-Te Cheng, R. Ian Bull,...
CSMR
1999
IEEE
13 years 11 months ago
A Change Impact Model for Changeability Assessment in Object-Oriented Software Systems
Growing maintenance costs have become a major concern for developers and users of software systems. Changeability is an important aspect of maintainability, especially in environm...
M. Ajmal Chaumun, Hind Kabaili, Rudolf K. Keller, ...