A built-in self-test (BIST) scheme is presented which both reduces overhead for detecting random-pattern-resistant (r.p.r.) faults as well as reduces power consumption during test...
Abstract. Many different index structures have been proposed for spatial databases to support efficient query processing. However, most of these index structures suffer from an exp...
Conversion of the flip-flops of the circuit into scan cells helps ease the test challenge; yet test application time is increased as serial shift operations are employed. Furthe...
This paper presents a new scan-based BIST scheme which achieves very high fault coverage without the deficiencies of previously proposed schemes. This approach utilizes scan order...
Kun-Han Tsai, Sybille Hellebrand, Janusz Rajski, M...
Complex event processing has become increasingly important in modern applications, ranging from supply chain management for RFID tracking to real-time intrusion detection. The goa...
Ming Li, Mo Liu, Luping Ding, Elke A. Rundensteine...