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123
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DAC
2005
ACM
15 years 4 months ago
Logic soft errors in sub-65nm technologies design and CAD challenges
Logic soft errors are radiation induced transient errors in sequential elements (flip-flops and latches) and combinational logic. Robust enterprise platforms in sub-65nm technolog...
Subhasish Mitra, Tanay Karnik, Norbert Seifert, Mi...
123
Voted
NSDI
2010
15 years 4 months ago
Exploring Link Correlation for Efficient Flooding in Wireless Sensor Networks
Existing flooding algorithms have demonstrated their effectiveness in achieving communication efficiency and reliability in wireless sensor networks. However, further performance ...
Ting Zhu, Ziguo Zhong, Tian He, Zhi-Li Zhang
162
Voted
GLOBECOM
2010
IEEE
15 years 3 days ago
Circulant-Graph-Based Fault-Tolerant Routing for All-Optical WDM LANs
High demands in data delivery latency and communication reliability encourage the use of fault-toleranceenhanced all-optical WDM networks. Low latency is satisfied by setting up a ...
Dexiang Wang, Janise McNair
122
Voted
WSNA
2003
ACM
15 years 8 months ago
Information assurance in sensor networks
Sensor networks are deployed to monitor the surroundings and keep the end-user informed about the events witnessed. Different types of events have different levels of importance f...
Budhaditya Deb, Sudeept Bhatnagar, Badri Nath
101
Voted
TOIS
2002
87views more  TOIS 2002»
15 years 2 months ago
Peer-to-peer data trading to preserve information
Data archiving systems rely on replication to preserve information. This paper discusses how a network of autonomousarchiving sites can trade data to achievethe most reliable repl...
Brian F. Cooper, Hector Garcia-Molina