515 search results - page 14 / 103 » A Reduced Complexity Algorithm for Minimizing N-Detect Tests |
ETS
2009
IEEE
2009
IEEE
Increasing Robustness of SAT-based Delay Test Generation Using Efficient Dynamic Learning Techniques
13 years 6 months ago
Due to the increased speed in modern designs, testing for delay faults has become an important issue in the postproduction test of manufactured chips. A high fault coverage is nee...
AUTOMATICA
2008
13 years 8 months ago
2008
This paper focuses on the NP-hard problem of reducing the complexity of piecewise polyhedral systems (e.g. polyhedral piecewise affine (PWA) systems). The results are fourfold. Fi...
CVPR
2008
IEEE
14 years 10 months ago
2008
IEEE
In this paper, we present novel techniques that improve the computational and memory efficiency of algorithms for solving multi-label energy functions arising from discrete MRFs o...
JAIR
2010
13 years 6 months ago
2010
Model-based diagnostic reasoning often leads to a large number of diagnostic hypotheses. The set of diagnoses can be reduced by taking into account extra observations (passive mon...
ICC
2009
IEEE
14 years 3 months ago
2009
IEEE
Abstract—In this paper we propose non-regenerative multicarrier multiple-input multiple-output (MIMO) relay techniques that minimize the mean-squared error (MSE) of the signal wa...