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ETS   2009 IEEE European Test Symposium
Wall of Fame | Most Viewed ETS-2009 Paper
ETS
2009
IEEE
128views Hardware» more  ETS 2009»
13 years 10 months ago
Algorithms for ADC Multi-site Test with Digital Input Stimulus
This paper reports two novel algorithms based on time-modulo reconstruction method intended for detection of the parametric faults in analogue-to-digital converters (ADC). In both ...
Xiaoqin Sheng, Hans G. Kerkhoff, Amir Zjajo, Guido...
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