515 search results - page 26 / 103 » A Reduced Complexity Algorithm for Minimizing N-Detect Tests |
DMDW
2000
13 years 9 months ago
2000
As views in a data warehouse become more complex, the view maintenance process can become very complicated and potentially very inefficient. Storing auxiliary views in the warehou...
VTS
1995
IEEE
13 years 12 months ago
1995
IEEE
Optimized locally exhaustive test pattern generators based on linear sums promise a low overhead, but have an irregular structure. The paper presents a new algorithm able to compu...
ITC
2003
IEEE
14 years 1 months ago
2003
IEEE
Energy Consumption Ratio (ECR) test, a current-based test, has shown its ability to reduce the impact of process variations and detect hard-to-detect faults. The effectiveness of ...
FSE
2009
Springer
14 years 3 months ago
2009
Springer
Matsui’s one-dimensional Alg. 2 can be used for recovering bits of the last round key of a block cipher. In this paper a truly multidimensional extension of Alg. 2 based on estab...
PAMI
2010
13 years 6 months ago
2010
—In this paper, we present novel techniques that improve the computational and memory efficiency of algorithms for solving multi-label energy functions arising from discrete MRF...