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» A Reduced Complexity Algorithm for Minimizing N-Detect Tests
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GLVLSI
2005
IEEE
122views VLSI» more  GLVLSI 2005»
14 years 10 days ago
Thermal aware cell-based full-chip electromigration reliability analysis
A hierarchical scheme with cells and modules is crucial for managing design complexity during a large integrated circuit design. We present a methodology for thermal aware cell-ba...
Syed M. Alam, Donald E. Troxel, Carl V. Thompson
KDD
2002
ACM
160views Data Mining» more  KDD 2002»
14 years 7 months ago
Scaling multi-class support vector machines using inter-class confusion
Support vector machines (SVMs) excel at two-class discriminative learning problems. They often outperform generative classifiers, especially those that use inaccurate generative m...
Shantanu Godbole, Sunita Sarawagi, Soumen Chakraba...
VTC
2007
IEEE
14 years 1 months ago
Modeling UpLink Power Control with Outage Probabilities
We investigate models for uplink interference in wireless systems. Our models account for the effects of outage probabilities. Such an accounting requires a nonlinear, even nonco...
Kenneth L. Clarkson, K. Georg Hampel, John D. Hobb...
ICANN
2007
Springer
14 years 27 days ago
Selection of Decision Stumps in Bagging Ensembles
Abstract. This article presents a comprehensive study of different ensemble pruning techniques applied to a bagging ensemble composed of decision stumps. Six different ensemble p...
Gonzalo Martínez-Muñoz, Daniel Hern&...
ESA
2004
Springer
139views Algorithms» more  ESA 2004»
14 years 3 days ago
Comparing Real Algebraic Numbers of Small Degree
We study polynomials of degree up to 4 over the rationals or a computable real subfield. Our motivation comes from the need to evaluate predicates in nonlinear computational geome...
Ioannis Z. Emiris, Elias P. Tsigaridas