1065 search results - page 27 / 213 » A Simulation Based Study of TLB Performance |
WSC
2007
13 years 10 months ago
2007
This paper presents a new job release methodology, WIPLOAD Control, especially in semiconductor wafer fabrication environment. The performance of the proposed methodology is evalu...
DATE
2003
IEEE
14 years 29 days ago
2003
IEEE
: Stresses are considered an integral part of any modern industrial DRAM test. This paper describes a novel method to optimize stresses for memory testing, using defect injection a...
VTC
2007
IEEE
14 years 1 months ago
2007
IEEE
This paper evaluates the effect of the channel estimation inaccuracy on the performance of an HSDPA system. This study provides some results from system level simulations that have...
CCGRID
2010
IEEE
13 years 6 months ago
2010
IEEE
—While computing speed continues increasing rapidly, data-access technology is lagging behind. Data-access delay, not the processor speed, becomes the leading performance bottlen...
CCGRID
2009
IEEE
14 years 2 months ago
2009
IEEE
— As the scale and complexity of parallel systems continue to grow, failures become more and more an inevitable fact for solving large-scale applications. In this research, we pr...