Reliability of nanometer circuits is becoming a major concern in today’s VLSI chip design due to interferences from multiple noise sources as well as radiation-induced soft erro...
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
This paper describes an automatic methodology for optimizing sample point selection for using in the framework of model order reduction (MOR). The procedure, based on the maximiza...
Aging effects, environmental changes, thermal drifts, and soft and hard faults affect physical systems by changing their nature and behavior over time. To cope with a process evolu...
The engineering of computer vision systems that meet application speci c computational and accuracy requirements is crucial to the deployment of real-life computer vision systems....
Michael Greiffenhagen, Visvanathan Ramesh, Dorin C...