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DAC
2005
ACM
13 years 9 months ago
Constraint-aware robustness insertion for optimal noise-tolerance enhancement in VLSI circuits
Reliability of nanometer circuits is becoming a major concern in today’s VLSI chip design due to interferences from multiple noise sources as well as radiation-induced soft erro...
Chong Zhao, Yi Zhao, Sujit Dey
DAC
2008
ACM
14 years 8 months ago
Study of the effects of MBUs on the reliability of a 150 nm SRAM device
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
Juan Antonio Maestro, Pedro Reviriego
DAC
2009
ACM
14 years 2 months ago
ARMS - automatic residue-minimization based sampling for multi-point modeling techniques
This paper describes an automatic methodology for optimizing sample point selection for using in the framework of model order reduction (MOR). The procedure, based on the maximiza...
Jorge Fernandez Villena, Luis Miguel Silveira
TNN
2008
124views more  TNN 2008»
13 years 7 months ago
Just-in-Time Adaptive Classifiers - Part II: Designing the Classifier
Aging effects, environmental changes, thermal drifts, and soft and hard faults affect physical systems by changing their nature and behavior over time. To cope with a process evolu...
Cesare Alippi, Manuel Roveri
CVPR
2000
IEEE
14 years 9 months ago
Statistical Modeling and Performance Characterization of a Real-Time Dual Camera Surveillance System
The engineering of computer vision systems that meet application speci c computational and accuracy requirements is crucial to the deployment of real-life computer vision systems....
Michael Greiffenhagen, Visvanathan Ramesh, Dorin C...