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» A Small Test Generator for Large Designs
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DATE
2008
IEEE
113views Hardware» more  DATE 2008»
14 years 2 months ago
Random Stimulus Generation using Entropy and XOR Constraints
Despite the growing research effort in formal verification, constraint-based random simulation remains an integral part of design validation, especially for large design componen...
Stephen Plaza, Igor L. Markov, Valeria Bertacco
PARA
2004
Springer
14 years 28 days ago
Semi-automatic Generation of Grid Computing Interfaces for Numerical Software Libraries
There is an immediate need to develop Grid interfaces for a large set of numerical software libraries, in order to make popular software of today available in the computing infrast...
Erik Elmroth, Rikard Skelander
APAQS
2001
IEEE
13 years 11 months ago
End-to-End Integration Testing
Integration testing has always been a challenge especially if the system under test is large with many subsystems and interfaces. This paper proposes an approach to design End-toE...
Raymond A. Paul
DAC
2007
ACM
14 years 8 months ago
Scan Test Planning for Power Reduction
Many STUMPS architectures found in current chip designs allow disabling of individual scan chains for debug and diagnosis. In a recent paper it has been shown that this feature can...
Christian G. Zoellin, Hans-Joachim Wunderlich, Jen...
PIMRC
2010
IEEE
13 years 5 months ago
Identifying boundaries of dominant regions dictating spectrum sharing opportunities for large secondary networks
An important parameter in determining a spectrum sharing opportunity is the level of interference power that secondary users may generate towards primary users. It is indicated in ...
Muhammad Aljuaid, Halim Yanikomeroglu