The paper presents a test pattern generation and fault simulation methodology for the detection of catastrophic faults in analogue circuits. The test methodology chosen for evalua...
Stephen J. Spinks, Chris D. Chalk, Ian M. Bell, Ma...
Placement is a critical component of today's physical synthesis flow with tremendous impact on the final performance of VLSI designs. However, it accounts for a significant p...
Charles J. Alpert, Andrew B. Kahng, Gi-Joon Nam, S...
: This paper describes ASF, a novel cell-level analog synthesis framework that can size and bias a given circuit topology subject to a set of performance objectives and a manufactu...
Michael Krasnicki, Rodney Phelps, James R. Hellums...
In this paper, the Simulated Evolution algorithm (SimE) is engineered to solve the optimization problem of multi-objective VLSI netlist bi-partitioning. The multi-objective versio...
Sadiq M. Sait, Aiman H. El-Maleh, Rush H. Al-Abuji
— Accurate generation of circuit specifications from test signatures is a difficult problem, since analytical expressions cannot precisely describe the nonlinear relationships ...
Byoungho Kim, Hongjoong Shin, Ji Hwan (Paul) Chun,...