235 search results - page 35 / 47 » A Tailored Capability Model for Inspection Process Improveme... |
PPAM
2007
Springer
14 years 2 months ago
2007
Springer
Abstract. In order to take full advantage of high-end computing platforms, scientific applications often require modifications to source codes, and to their build systems that ge...
WSC
2007
13 years 10 months ago
2007
This paper is motivated by a case study performed at a company that manufactures two main types of customized products. In an effort to significantly increase their throughput cap...
AVSS
2006
IEEE
13 years 11 months ago
2006
IEEE
The success of any Bayesian particle filtering based tracker relies heavily on the ability of the likelihood function to discriminate between the state that fits the image well an...
3DIM
2007
IEEE
13 years 12 months ago
2007
IEEE
Traditional Shape-from-Shading (SFS) techniques aim to solve an under-constrained problem: estimating depth map from one single image. The results are usually brittle from real im...
WSC
2000
13 years 9 months ago
2000
MODELING FOR ENGINEERING AND ENGAGEMENT LEVEL SIMULATIONS Robert M. McGraw Richard A. MacDonald RAM Laboratories, Inc. 6540 Lusk Boulevard, Suite C200 San Diego, CA 92121, U.S.A. ...