A novel approach to testing sequential circuits that uses multi-level decision diagram representations is introduced. The proposed algorithm consists of a combination of scanning ...
Abstract. The classical work on test case generation and formal methods focuses either on algebraic or model-based specifications. In this paper we propose an approach to derive t...
Porting an application written for personal computer to embedded devices requires conversion of floating-point numbers and operations into fixed-point ones. Testing the conversion...
A fault-oriented sequential circuit test generator is described in which various types of distinguishing sequences are derived, both statically and dynamically, to aid the test ge...
Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. P...
This paper introduces a method for the semi-automatic generation of grammar test items by applying Natural Language Processing (NLP) techniques. Based on manually-designed pattern...