295 search results - page 10 / 59 » A Test Generation Strategy for Pairwise Testing |
DATE
1999
IEEE
14 years 27 days ago
1999
IEEE
A novel approach to testing sequential circuits that uses multi-level decision diagram representations is introduced. The proposed algorithm consists of a combination of scanning ...
ICTAC
2004
Springer
14 years 1 months ago
2004
Springer
Abstract. The classical work on test case generation and formal methods focuses either on algebraic or model-based specifications. In this paper we propose an approach to derive t...
ENTCS
2010
13 years 3 months ago
2010
Porting an application written for personal computer to embedded devices requires conversion of floating-point numbers and operations into fixed-point ones. Testing the conversion...
VTS
1996
IEEE
14 years 22 days ago
1996
IEEE
A fault-oriented sequential circuit test generator is described in which various types of distinguishing sequences are derived, both statically and dynamically, to aid the test ge...
ACL
2006
13 years 10 months ago
2006
This paper introduces a method for the semi-automatic generation of grammar test items by applying Natural Language Processing (NLP) techniques. Based on manually-designed pattern...