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» A Test Generation Strategy for Pairwise Testing
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VTS
1995
IEEE
94views Hardware» more  VTS 1995»
14 years 3 days ago
Synthesis of locally exhaustive test pattern generators
Optimized locally exhaustive test pattern generators based on linear sums promise a low overhead, but have an irregular structure. The paper presents a new algorithm able to compu...
Günter Kemnitz
IPPS
1998
IEEE
14 years 25 days ago
Meta-heuristics for Circuit Partitioning in Parallel Test Generation
In this communication Simulated Annealing and Genetic Algorithms, are applied to the graph partitioning problem. These techniques mimic processes in statistical mechanics and biol...
Consolación Gil, Julio Ortega, Antonio F. D...
GECCO
2007
Springer
276views Optimization» more  GECCO 2007»
14 years 2 months ago
Automatic mutation test input data generation via ant colony
Fault-based testing is often advocated to overcome limitations of other testing approaches; however it is also recognized as being expensive. On the other hand, evolutionary algor...
Kamel Ayari, Salah Bouktif, Giuliano Antoniol
KBSE
2005
IEEE
14 years 2 months ago
An analysis of rule coverage as a criterion in generating minimal test suites for grammar-based software
The term grammar-based software describes software whose input can be specified by a context-free grammar. This grammar may occur explicitly in the software, in the form of an in...
Mark Hennessy, James F. Power
GI
2007
Springer
14 years 2 months ago
Automated Test Case Selection Based on a Similarity Function
: A strategy for automatic test case selection based on the use of a similarity function is presented. Test case selection is a crucial activity to model-based testing since the nu...
Emanuela G. Cartaxo, Francisco G. Oliveira Neto, P...