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» A Test Generation Strategy for Pairwise Testing
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EURODAC
1994
IEEE
94views VHDL» more  EURODAC 1994»
14 years 23 days ago
A Study of Undetectable Non-Feedback Shorts for the Purpose of Physical-DFT
Undetectable shorts may decrease the long term reliability of a circuit, cause intermittent failures, add noise and delay, or increase test pattern generation costs. This paper de...
Richard McGowen, F. Joel Ferguson
APLAS
2008
ACM
13 years 10 months ago
The Complexity of Coverage
Abstract. We study the problem of generating a test sequence that achieves maximal coverage for a reactive system under test. We formulate the problem as a repeated game between th...
Krishnendu Chatterjee, Luca de Alfaro, Rupak Majum...
ICIS
2000
13 years 10 months ago
Personalization of search engine services for effective retrieval and knowledge management
The Internet and corporate intranets provide far more information than anybody can absorb. People use search engines to find the information they require. However, these systems t...
Weiguo Fan, Michael D. Gordon, Praveen Pathak
BMCBI
2006
199views more  BMCBI 2006»
13 years 8 months ago
PageMan: An interactive ontology tool to generate, display, and annotate overview graphs for profiling experiments
Background: Microarray technology has become a widely accepted and standardized tool in biology. The first microarray data analysis programs were developed to support pair-wise co...
Björn Usadel, Axel Nagel, Dirk Steinhauser, Y...
CIDM
2007
IEEE
14 years 3 months ago
Reactive Query Policies: A Formalism for Planning with Volatile External Information
— To generate plans for collecting data for data mining, an important problem is information volatility during planning: the information needed by the planning system may change ...
Tsz-Chiu Au, Dana S. Nau