158 search results - page 17 / 32 » A Test Pattern Generation Algorithm Exploiting Behavioral In... |
SIGMOD
2010
ACM
14 years 14 days ago
2010
ACM
We study recommendations in applications where there are temporal patterns in the way items are consumed or watched. For example, a student who has taken the Advanced Algorithms c...
GECCO
2007
Springer
14 years 1 months ago
2007
Springer
When facing dynamic optimization problems the goal is no longer to find the extrema, but to track their progression through the space as closely as possible. Over these kind of ov...
DAC
2010
ACM
13 years 11 months ago
2010
ACM
Fault simulation is essential in test generation, design for test and reliability assessment of integrated circuits. Reliability analysis and the simulation of self-test structure...
ISPASS
2007
IEEE
14 years 1 months ago
2007
IEEE
The ongoing trend of increasing computer hardware and software complexity has resulted in the increase in complexity and overheads of cycle-accurate processor system simulation, e...
GECCO
2009
Springer
13 years 11 months ago
2009
Springer
This paper presents a novel evolutionary approach to solve numerical optimization problems, called Adaptive Evolution (AEv). AEv is a new micro-population-like technique because i...