158 search results - page 4 / 32 » A Test Pattern Generation Algorithm Exploiting Behavioral In... |
SIGSOFT
2010
ACM
13 years 5 months ago
2010
ACM
During maintenance, software is modified and evolved to enhance its functionality, eliminate faults, and adapt it to changed or new platforms. In this demo, we present BERT, a too...
GIS
2008
ACM
14 years 8 months ago
2008
ACM
d Abstract] K. Buchin Dept. Computer Science Utrecht University The Netherlands buchin@cs.uu.nl M. Buchin Dept. Computer Science Utrecht University The Netherlands maike@cs.uu.nl ...
IJAR
2011
12 years 11 months ago
2011
Sequential pattern mining is a crucial but challenging task in many applications, e.g., analyzing the behaviors of data in transactions and discovering frequent patterns in time se...
ETS
2009
IEEE
2009
IEEE
Increasing Robustness of SAT-based Delay Test Generation Using Efficient Dynamic Learning Techniques
13 years 5 months ago
Due to the increased speed in modern designs, testing for delay faults has become an important issue in the postproduction test of manufactured chips. A high fault coverage is nee...
FATES
2004
Springer
13 years 11 months ago
2004
Springer
Abstract. Classical state-oriented testing approaches are based on simple machine models such as Labelled Transition Systems (LTSs), in which data is represented by concrete values...