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» A Tool-Supported Approach to Testing UML Design Models
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PODS
2003
ACM
114views Database» more  PODS 2003»
16 years 3 months ago
An information-theoretic approach to normal forms for relational and XML data
Normalization as a way of producing good database designs is a well-understood topic. However, the same problem of distinguishing well-designed databases from poorly designed ones...
Marcelo Arenas, Leonid Libkin
MTDT
2000
IEEE
137views Hardware» more  MTDT 2000»
15 years 8 months ago
Diagnostic Testing of Embedded Memories Based on Output Tracing
A new approach to diagnostic testing of embedded memories is presented which enables the design of tests that provide complete detection and distinguishing of all faults in a give...
Dirk Niggemeyer, Elizabeth M. Rudnick, Michael Red...
DATE
2004
IEEE
174views Hardware» more  DATE 2004»
15 years 7 months ago
Graph-Based Functional Test Program Generation for Pipelined Processors
Functional verification is widely acknowledged as a major bottleneck in microprocessor design. While early work on specification driven functional test program generation has prop...
Prabhat Mishra, Nikil Dutt
GLVLSI
2002
IEEE
108views VLSI» more  GLVLSI 2002»
15 years 8 months ago
Protected IP-core test generation
Design simplification is becoming necessary to respect the target time-to-market of SoCs, and this goal can be obtained by using predesigned IP-cores. However, their correct inte...
Alessandro Fin, Franco Fummi
ET
2000
145views more  ET 2000»
15 years 3 months ago
Fast Test Pattern Generation for Sequential Circuits Using Decision Diagram Representations
The paper presents a novel hierarchical approach to test pattern generation for sequential circuits based on an input model of mixed-level decision diagrams. A method that handles,...
Jaan Raik, Raimund Ubar