Normalization as a way of producing good database designs is a well-understood topic. However, the same problem of distinguishing well-designed databases from poorly designed ones...
A new approach to diagnostic testing of embedded memories is presented which enables the design of tests that provide complete detection and distinguishing of all faults in a give...
Dirk Niggemeyer, Elizabeth M. Rudnick, Michael Red...
Functional verification is widely acknowledged as a major bottleneck in microprocessor design. While early work on specification driven functional test program generation has prop...
Design simplification is becoming necessary to respect the target time-to-market of SoCs, and this goal can be obtained by using predesigned IP-cores. However, their correct inte...
The paper presents a novel hierarchical approach to test pattern generation for sequential circuits based on an input model of mixed-level decision diagrams. A method that handles,...