729 search results - page 16 / 146 » A Transitive Closure Based Algorithm for Test Generation |
IWANN
1995
Springer
13 years 11 months ago
1995
Springer
This paper presents a comparative analysis of neural networks, simulated annealing, and genetic algorithms in the determination of input patterns for testing analog circuits. The ...
ALENEX
2001
13 years 9 months ago
2001
The purpose of this paper is to provide a preliminary report on the rst broad-based experimental comparison of modern heuristics for the asymmetric traveling salesmen problem ATSP....
ASPDAC
2009
ACM
14 years 2 months ago
2009
ACM
Low power circuits have become a necessary part in modern designs. Retention flip-flop is one of the most important components in low power designs. Conventional test methodologie...
APN
2001
Springer
14 years 3 days ago
2001
Springer
Reachability analysis and simulation tools for high-level nets spend a significant amount of the computing time in performing enabling tests, determining the assignments under whi...
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GECCO
2003
Springer
14 years 25 days ago
2003
Springer
Evolutionary Testing (ET) has been shown to be very successful for testing real world applications [10]. The original ET approach focusesonsearching for a high coverage of the test...