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» A Transitive Closure Based Algorithm for Test Generation
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ICCAD
2010
IEEE
133views Hardware» more  ICCAD 2010»
13 years 5 months ago
Testing methods for detecting stuck-open power switches in coarse-grain MTCMOS designs
Coarse-grain multi-threshold CMOS (MTCMOS) is an effective power-gating technique to reduce IC's leakage power consumption by turning off idle devices with MTCMOS power switc...
Szu-Pang Mu, Yi-Ming Wang, Hao-Yu Yang, Mango Chia...
DAC
2009
ACM
14 years 8 months ago
Generating test programs to cover pipeline interactions
Functional validation of a processor design through execution of a suite of test programs is common industrial practice. In this paper, we develop a high-level architectural speci...
Thanh Nga Dang, Abhik Roychoudhury, Tulika Mitra, ...
ASIAN
2006
Springer
140views Algorithms» more  ASIAN 2006»
13 years 11 months ago
Modeling Urgency in Component-Based Real-Time Systems
A component-based realtime system is a simple model for the server-client relation with time constraints. This paper presents an efficient algorithm, called a blackbox testing algo...
Nguyen Van Tang, Dang Van Hung, Mizuhito Ogawa
IJCAI
2003
13 years 9 months ago
A Planning Algorithm for Predictive State Representations
We address the problem of optimally controlling stochastic environments that are partially observable. The standard method for tackling such problems is to define and solve a Part...
Masoumeh T. Izadi, Doina Precup
IJCAI
2007
13 years 9 months ago
Fault-Model-Based Test Generation for Embedded Software
Testing embedded software systems on the control units of vehicles is a safety-relevant task, and developing the test suites for performing the tests on test benches is time-consu...
Michael Esser, Peter Struss