729 search results - page 39 / 146 » A Transitive Closure Based Algorithm for Test Generation |
DATE
2007
IEEE
14 years 2 months ago
2007
IEEE
A high-level test synthesis (HLTS) method targeted for delay fault testability is presented. The proposed method, when combined with hierarchical test pattern generation for embed...
IJCAI
2007
13 years 9 months ago
2007
The paper presents the theoretical foundations and an algorithm to reduce the efforts of testing physical systems. A test is formally described as a set of stimuli (inputs to the ...
FATES
2003
Springer
14 years 27 days ago
2003
Springer
Use of model-checking approaches for test generation from requirement models have been proposed by several researchers. These approaches leverage the witness (or counter-example) ...
AUSAI
2003
Springer
14 years 27 days ago
2003
Springer
An important task in machine learning is determining which learning algorithm works best for a given data set. When the amount of data is small the same data needs to be used repea...
FOGA
1994
13 years 9 months ago
1994
In the Infinite Population Simple Genetic Algorithm, stability of fixed points is considered when mutation is zero. The analysis is based on the spectrum of the differential of th...