729 search results - page 45 / 146 » A Transitive Closure Based Algorithm for Test Generation |
HM
2005
Springer
14 years 1 months ago
2005
Springer
Abstract. This paper introduces a new algorithm, based on the concept of ejection chains, to effectively target vehicle routing problems with time window constraints (VRPTW). Ejec...
CIKM
2005
Springer
14 years 1 months ago
2005
Springer
Testing reachability between nodes in a graph is a well-known problem with many important applications, including knowledge representation, program analysis, and more recently, bi...
PTS
2008
13 years 9 months ago
2008
Abstract. Model-based testing (MBT) seems to be technically superior to conventional test automation. However, MBT features some difficulties that can hamper its deployment in indu...
AIME
2007
Springer
14 years 1 months ago
2007
Springer
Abstract. Most test-selection algorithms currently in use with probabilistic networks select variables myopically, that is, test variables are selected sequentially, on a one-by-on...
VTS
1999
IEEE
13 years 12 months ago
1999
IEEE
High-level test pattern generation is today a widely investigated research topic. The present paper proposes a fully automated, simulation-based ATPG system, to address test patte...