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DATE
2002
IEEE
89views Hardware» more  DATE 2002»
15 years 11 months ago
A Hierarchical Test Scheme for System-On-Chip Designs
System-on-chip (SOC) design methodology is becoming the trend in the IC industry. Integrating reusable cores from multiple sources is essential in SOC design, and different design...
Jin-Fu Li, Hsin-Jung Huang, Jeng-Bin Chen, Chih-Pi...
AUTOMATICA
2010
72views more  AUTOMATICA 2010»
15 years 6 months ago
A sufficient condition to test identifiability of nonlinear delayed-differential models with constant delays and multi-inputs
In this paper, an original result in terms of a sufficient condition to test identifiability of nonlinear delayed-differential models with constant delays and multi-inputs is give...
Carine Jauberthie, Louise Travé-Massuy&egra...
SIAMDM
2002
52views more  SIAMDM 2002»
15 years 5 months ago
Testing k-colorability
Let G be a graph on n vertices and suppose that at least n2 edges have to be deleted from it to make it k-colorable. It is shown that in this case most induced subgraphs of G on c...
Noga Alon, Michael Krivelevich
TAP
2010
Springer
145views Hardware» more  TAP 2010»
15 years 4 months ago
QuickSpec: Guessing Formal Specifications Using Testing
We present QuickSpec, a tool that automatically generates algebraic specifications for sets of pure functions. The tool is based on testing, rather than static analysis or theorem ...
Koen Claessen, Nicholas Smallbone, John Hughes
DCC
2011
IEEE
15 years 1 months ago
Collaboration in Distributed Hypothesis Testing with Quantized Prior Probabilities
The effect of quantization of prior probabilities in a collection of distributed Bayesian binary hypothesis testing problems over which the priors themselves vary is studied. In ...
Joong Bum Rhim, Lav R. Varshney, Vivek K. Goyal