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    2007
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    A comprehensive model for PMOS NBTI degradation: Recent progress
    15 years 4 months ago
    A comprehensive model for PMOS NBTI degradation: Recent progress
    Download  cobweb.ecn.purdue.edu
    Muhammad Ashraful Alam, Haldun Kufluoglu, D. Vargh...
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    DAC
    2006
    ACM
    147views Computer Architecture» more  DAC 2006»
    Modeling and minimization of PMOS NBTI effect for robust nanometer design
    15 years 10 months ago
    Modeling and minimization of PMOS NBTI effect for robust nanometer design
    Download  ptm.asu.edu
    Negative bias temperature instability (NBTI) has become the dominant reliability concern for nanoscale PMOS transistors. In this paper, a predictive model is developed for the deg...
    Rakesh Vattikonda, Wenping Wang, Yu Cao
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