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194
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CAMP
2005
IEEE
15 years 10 months ago
2005
IEEE
— This paper describes the mapping of a recently introduced template matching algorithm based on the Normalized Cross Correlation (NCC) on a general purpose processor endowed wit...
156
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DAC
2010
ACM
15 years 4 months ago
2010
ACM
With technology scaling down to 90nm and below, many yield-driven design and optimization methodologies have been proposed to cope with the prominent process variation and to incr...
154
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ICCAD
2006
IEEE
16 years 1 months ago
2006
IEEE
Most existing RCL−1 circuit reductions stamp inverse inductance L−1 elements by a second-order nodal analysis (NA). The NA formulation uses nodal voltage variables and describ...
133
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DAC
2009
ACM
15 years 11 months ago
2009
ACM
It is unknown how to include stochastic process variation into fast-multipole-method (FMM) for a full chip capacitance extraction. This paper presents a parallel FMM extraction us...
139
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KDD
2004
ACM
16 years 5 months ago
2004
ACM
Kernel k-means and spectral clustering have both been used to identify clusters that are non-linearly separable in input space. Despite significant research, these methods have re...