595 search results - page 25 / 119 » A genetic approach for random testing of database systems |
LSGRID
2004
Springer
14 years 1 months ago
2004
Springer
In this study, a new Genetic Algorithm (GA) using the Tabu · Local Search mechanism is proposed. The GA described in this paper is considered a Mega Process GA, which has an effe...
SEMWEB
2010
Springer
13 years 5 months ago
2010
Springer
OWL 2 RL was standardized as a less expressive but scalable subset of OWL 2 that allows a forward-chaining implementation. However, building an enterprise-scale forward-chaining ba...
ICSEA
2007
IEEE
14 years 2 months ago
2007
IEEE
Automatic test data generation helps testers to validate software against user requirements more easily. Test data can be generated from many sources; for example, experience of t...
EH
2003
IEEE
14 years 1 months ago
2003
IEEE
This paper describes a technique for evolving similar solutions to similar configuration design problems. Using the configuration design of combination logic circuits as a testb...
VTS
1999
IEEE
13 years 12 months ago
1999
IEEE
High-level test pattern generation is today a widely investigated research topic. The present paper proposes a fully automated, simulation-based ATPG system, to address test patte...