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DAC
2008
ACM
14 years 8 months ago
Study of the effects of MBUs on the reliability of a 150 nm SRAM device
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
Juan Antonio Maestro, Pedro Reviriego
CIIT
2004
104views Communications» more  CIIT 2004»
13 years 9 months ago
Semi-automatic compensation of the propagation delay in fault-tolerant systems
In control systems the jitter is a major problem since in a time-varying system the theoretical results for analysis and design of time-invariant systems cannot be used directly. ...
Thomas Losert, Wilfried Elmenreich, Martin Schlage...
ASAP
2000
IEEE
184views Hardware» more  ASAP 2000»
13 years 12 months ago
Tradeoff Analysis and Architecture Design of a Hybrid Hardware/Software Sorter
Sorting long sequences of keys is a problem that occurs in many different applications. For embedded systems, a uniprocessor software solution is often not applicable due to the l...
Marcus Bednara, Oliver Beyer, Jürgen Teich, R...
MM
2005
ACM
371views Multimedia» more  MM 2005»
14 years 1 months ago
Data grid for large-scale medical image archive and analysis
Storage and retrieval technology for large-scale medical image systems has matured significantly during the past ten years but many implementations still lack cost-effective backu...
H. K. Huang, Aifeng Zhang, Brent J. Liu, Zheng Zho...