225 search results - page 14 / 45 » A knowledge-based approach to the layout analysis |
CC
2007
Springer
14 years 1 months ago
2007
Springer
As the amount of data used by programs increases due to the growth of hardware storage capacity and computing power, efficient memory usage becomes a key factor for performance. Si...
SPATIALCOGNITION
2000
Springer
13 years 11 months ago
2000
Springer
The paper analyzes a diagrammatic reasoning problem that consists in finding a graphical layout which simultaneously satisfies a set of constraints expressed in a formal language a...
BMCBI
2010
13 years 7 months ago
2010
Background: The large amount of high-throughput genomic data has facilitated the discovery of the regulatory relationships between transcription factors and their target genes. Wh...
DFT
2004
IEEE
13 years 11 months ago
2004
IEEE
We present a model for computing the probability of a parametric failure due to a spot defect. The analysis is based on electromigration in conductors under unidirectional current...
EURODAC
1995
IEEE
13 years 11 months ago
1995
IEEE
The presented fault model uniquely describes all structural changes in the transistor net list that can be caused by spot defects, including faults that connect more than two nets...