185 search results - page 6 / 37 » A metric approach toward point process divergence |
DATE
2003
IEEE
14 years 9 days ago
2003
IEEE
This paper proposes a novel methodology tailored to design embedded systems, taking into account the emerging market needs, such as hw/sw partitioning, object-oriented specificati...
DSN
2000
IEEE
13 years 11 months ago
2000
IEEE
This paper presents a generic methodology to transform a protocol resilient to process crashes into one resilient to arbitrary failures in the case where processes run the same te...
ICASSP
2011
IEEE
12 years 10 months ago
2011
IEEE
In this paper we propose a novel corner detection algorithm using local adaptive thresholding and iterative approaching. First, a new metric is defined to measure the saliency of ...
ICIP
2004
IEEE
14 years 8 months ago
2004
IEEE
This paper addresses the problem of calibrating a pin-hole camera from images of 1D objects. Assuming a unit aspect ratio and zero skew, we introduce a novel and simple approach t...
GECCO
2008
Springer
13 years 8 months ago
2008
Springer
The aim of process mining is to identify and extract process patterns from data logs to reconstruct an overall process flowchart. As business processes become more and more comple...