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» A modular test structure for CMOS mismatch characterization
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DATE
2008
IEEE
174views Hardware» more  DATE 2008»
14 years 2 months ago
Calibration of Integrated CMOS Hall Sensors Using Coil-on-Chip in ATE Environment
Due to high demand for hall sensors mostly in the automotive and industrial applications, development and manufacturing of hall sensors in System-on-Chip (SoC) became more importa...
Mustafa Badaroglu, Guy Decabooter, Francois Laulan...
IROS
2008
IEEE
131views Robotics» more  IROS 2008»
14 years 2 months ago
OpenRDK: A modular framework for robotic software development
— Intense efforts to define a common structure in robotic applications, both from a conceptual and from an implementation point of view, have been carried out in the last years ...
Daniele Calisi, Andrea Censi, Luca Iocchi, Daniele...
IPSN
2007
Springer
14 years 1 months ago
Lucid dreaming: reliable analog event detection for energy-constrained applications
— Existing sensor network architectures are based on the assumption that data will be polled. Therefore, they are not adequate for long-term battery-powered use in applications t...
Sasha Jevtic, Mathew Kotowsky, Robert P. Dick, Pet...