1175 search results - page 15 / 235 » A scalable method for the generation of small test sets |
ATS
2000
IEEE
14 years 5 days ago
2000
IEEE
We present a new test generation procedure for sequential circuits using newly traversed state and newly detected fault information obtained between successive iterations of vecto...
CADE
2006
Springer
14 years 8 months ago
2006
Springer
In this paper we introduce several new improvements to the bottom-up model generation (BUMG) paradigm. Our techniques are based on non-trivial transformations of first-order probl...
ICIP
2003
IEEE
14 years 9 months ago
2003
IEEE
A scalable video coder cannot be equally efficient over a wide range of bit-rates unless both the video data and the motion information are scalable. We propose a wavelet-based, h...
PTS
2010
13 years 6 months ago
2010
This paper addresses the challenge of generating test sets that achieve functional coverage, in the absence of a complete specification. The inductive testing technique works by p...
FMICS
2006
Springer
13 years 11 months ago
2006
Springer
Abstract. The design flow of systems-on-a-chip (SoCs) identifies several abstraction levels higher than the Register-Transfer-Level that constitutes the input of the synthesis tool...