1175 search results - page 28 / 235 » A scalable method for the generation of small test sets |
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
We provide a general formulation for the code-based test compression problem with fixed-length input blocks and propose a solution approach based on Evolutionary Algorithms. In c...
EURODAC
1994
IEEE
13 years 12 months ago
1994
IEEE
This paper presents Resist, a recursive test pattern generation (TPG) algorithm for path delay fault testing of scan-based circuits. In contrast to other approaches, it exploits t...
FGR
2004
IEEE
13 years 11 months ago
2004
IEEE
Data collection for both training and testing a classifier is a tedious but essential step towards face detection and recognition. All of the statistical methods suffer from this ...
TCAD
2008
13 years 7 months ago
2008
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
IPPS
2009
IEEE
14 years 2 months ago
2009
IEEE
We describe a scalable and general-purpose framework for auto-tuning compiler-generated code. We combine Active Harmony’s parallel search backend with the CHiLL compiler transfo...