1175 search results - page 33 / 235 » A scalable method for the generation of small test sets |
AAAI
2000
13 years 9 months ago
2000
The random k-SAT model is extensively used to compare satisfiability algorithms or to find the best settings for the parameters of some algorithm. Conclusions are derived from the...
ET
2002
13 years 7 months ago
2002
As System on a Chip (SoC) testing faces new challenges, some new test architectures must be developed. This paper describes a Test Access Mechanism (TAM) named CASBUS that solves ...
ICSM
1993
IEEE
13 years 12 months ago
1993
IEEE
The purpose of regression testing is to ensure that bug xes and new functionality introduced in a new version of a software do not adversely a ect the correct functionality inheri...
DAC
2007
ACM
14 years 8 months ago
2007
ACM
Due to increased variability trends in nanoscale integrated circuits, statistical circuit analysis has become essential. We present a novel method for post-silicon analysis that g...
BMCBI
2008
13 years 8 months ago
2008
Background: Identifying quantitative trait loci (QTL) for both additive and epistatic effects raises the statistical issue of selecting variables from a large number of candidates...